Characterisation of metallic particle distributions by scanning near-field optical microscopy (SNOM) in simultaneous reflection and transmission mode

Unlike conventional optics, scanning near-field optical microscopy (SNOM) overcomesthe Rayleigh criterion and can therefore achieve better resolutions than conventionaloptical microscopes. This feature is utilized to measure the optical propertiesof different silver particle distributions on a glass surface. This paper mainlylays focus on intensity correction of the optical data due to topographic...